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  • Ellipsometer / multi-wavelength

543 nm, 594 nm, 612 nm, 635 nm, 1164 nm

Article: 00175313

Ellipsometer / multi-wavelength

The PHE101M is a multi-wavelegnth ellipsometer from Angstrom Advanced that is ideal for measuring the refractive index and thickness of single and multi-layer films at several wavelengths. It has a wide variable angle at 10-90° which ...

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