RITM Industry

address+38 044 331 91 18
mon-fri: 09.00-18.00
e-mail: sales@ritmindustry.com

x

Price request

Implement Industry Ideas
+38 044 223 09 23
+38 050 102 89 91
sales@ritmindustry.com

FEM microscopes, X-ray microscopes, Electron microscopes

CAMECA

  • 3D microscope / scanning probe / for research
  • 3D microscope / scanning probe / for research

LEAP 5000 series

Article: 00049090

3D microscope / scanning probe / for research

CAMECA's new 3D Atom Probe Microscope: unmatched 3D sub-nanometer analytical performance!

CAMECA innovation has delivered its new, cutting-edge atom probe microscope offering increased detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed!

Increased analysis volumes & detection efficiency
Unparalleled compositional precision & accuracy
Greater productivity & ease-of-use

Thanks to its impressive new features and enhancements, the LEAP 5000 platform collects nanoscale information from a microscale dataset in just a few hours!

>> Increased detection efficiency provides unparalleled sensitivity

>> Improved Field-of-View and detection uniformity - the ultimate 3D spatial resolution

>> Enhanced multi-hit detection capabilities for the most accurate compositional measurements

>> Faster and variable repetition rate for ultra-high speed data acquisition

>> New robust & ergonomic platform for increased ease-of-use and reduced time-to-knowledge

>> Live-time monitoring to ensure the highest quality data in every measurement

>> Advanced laser control algorithms provide measurably improved sample yields

Specifications

  • Type: 3D, scanning probe
  • Technical applications: for research

Other items

In this category | In this category, (CAMECA)

Leave request for price calculation right now, we will send you best prices.

LLC "RITM INDUSTRY" 34, Verkhovnoy Rady Blvd. Kyiv, UA-02094 +38 044 223 09 23 info@ritmindustry.com
RITM Industry © 2015 -