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  • Atomic force microscope / high-resolution

AFM5300E

Article: 00049019

Atomic force microscope / high-resolution

An environment control type probe microscope (SPM) that supports various measurement environments including air, vacuum, and liquids. In addition to observing shape or properties of material surfaces in various temperature environments, it is able to use a surface change temperature monitor function to quantitatively evaluate changes in surface properties by a process that continuously changes temperatures.

Specifications

  • Type: atomic force
  • Other characteristics: high-resolution

Other items

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