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  • Atomic force microscope / topography

AFM5000II

Article: 00049017

Atomic force microscope / topography

Advanced auto measurement parameter tuning function and new GUI enable simple nano-imaging.

1. RealTuneII Auto Tuning Functions for Optimal Measurement Parameters
The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever?s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!

Specifications

  • Type: atomic force
  • Technical applications: topography

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