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  • Atomic force microscope / transmission electron / high-resolution

H-9500

Article: 00049016

Atomic force microscope / transmission electron / high-resolution

Atomic resolution 300kV transmission electron microscope

Atomic resolution electron microscopy is becoming increasingly important and indispensable for the R&D of semiconductors and advanced materials where micro-fabrication technologies have entered into the sub-nanometer realm. In response to this high demand, Hitachi High Technologies, Inc. has developed the H-9500 transmission electron microscope with field proven high performance in high resolution transmission electron microscopy in addition to a number of user-friendly unique functions. The latest digital technology is incorporated to facilitate obtaining atomic level structural information in a timely manner.

Features
Windows® compatible GUI design.
High specimen throughput, 1 minute for specimen exchange and 5 minutes for voltage ramp up (300 kV) and beam on.

Stable high resolution microscopy

Point-to-point resolution of 0.18nm and lattice resolution of 0.1nm.
A stable 5-axis eucentric goniometer stage.

Excellent performance reliability

Field-proven 10-stage accelerator gun design.
High voltage resistor cable design.

Valuable optional accessories

Compatible specimen holder for use with Hitachi TEM, FIB and STEM systems.
A variety of specimen holders that provide heating, cooling and gas-injection capabilities for atomic resolution dynamic studies.

Note?Images on the FPD (flat panel display) are simulated.

Specifications

  • Type: atomic force, transmission electron
  • Other characteristics: high-resolution
  • Optical resolution: 0.1 nm, 0.18 nm

Other items

In this category | In this category, (Hitachi High-Technologies Europe)

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