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FEM microscopes, X-ray microscopes, Electron microscopes

DME - Danish Micro Engineering A/S

  • Atomic force microscopes (AFM) scanner

DS 95 series

Article: 00049117

Atomic force microscopes (AFM) scanner

All scanners of the DS 95 series are probe scanners, i.e. during scanning, the cantilever is moved from side to side over the sample and thus provides examination of any samples. The laser unit is moved with the scanner during scanning, i.e. the laser point will not move on the back of the cantilever during scanning. Thus disturbances in the reflection layer on the cantilever do not influence the AFM image.

The scanners of the DS 95 series are available in a number of different variants:
The DS 95-50 scanner has a standard scan range of 50 µm x 50 µm x 5 µm. It can also be delivered with a larger Z scan range of 15 µm.
The DS 95-200 scanner has a standard scan range of 200 µm x 200 µm x 15 µm. Irrespective of the scan range, all scanners have atomic resolution in the Z direction.

The AFM scanners work in AC and DC mode (contact and non-contact mode) as well as support the measurement of the lateral torsion of the cantilever (Lateral Force mode).

Specifications

  • Product applications: for atomic force microscopes (AFM)

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