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LADP800

Article: 00054405

Profiler

Series LADP800 Large Area Auger Depth Profiler
Model LADP800

Thin Film Elemental Composition at Different Depth

Model LADP800 is the compact instrument to measure elemental surface composition of thin films using Auger electron spectroscopy and Argon ion bombardment to obtain composition v.s depth. In addition, the instrument can integrate gas emission analysis from thin film.


Features:

Customized side UHV attachment to fit most of the vacuum deposition chambers.

Specifications:
Specifications for LADP800 are currently available only upon request.

Specifications

Other items

In this category | In this category, (OCI Vacuum Microengineering)

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