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FT9500 Series

Article: 00091270

Coating thickness gauge / benchtop

Consequently, FT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to insufficient fluorescent X-ray intensity from measurement samples, also suitable for RoHS&ELV analysis.

1. Ultra Thin Film and Multilayered Film Measurement
Poly capillary, X-ray focusing optics system, enables micro beam size of less than 0.1 mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, FT9500 series has a capability of quantitative measurement of single nano meter of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layer sin multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.

2. Mapping
Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.

3. Hazardous Substance Analysis (for RoHS and ELV compliance)
FT9500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector (liquid nitrogen free) is able to detect microelements. Examples are Pb in Pb-free solder and electoless Nickel that are typical component in Electric, Electronics, and Auto products.

Specifications

  • Applications: coating
  • Other characteristics: benchtop

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