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FT9400 Series

Article: 00091271

Coating thickness gauge / benchtop

FT9400 series is a high performance thickness gauge that features a 75 W high powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all coating thickness measurement needs, including thin film, alloy film and submicroscopic measurements. Can be also used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement.

1. Dual Detector
Employs both a semiconductor detector (no LN2 required) that has superior X-ray energy resolution and a proportional counter that has a superior coefficient rate. The semiconductor detector is especially able to distinguish between elements that have contiguous energies such as Ni and Cu, and has the following merits.

Ni/Cu and Au/Ni/Cu measured without a secondary filter.
In the case of a print board that contain Br, capable of high precision Au coating thickness measurements without interference from Br.
Capable of measuring ultra-thin Au films less than 0.01 µm.
2. Thin film FP Software
Thin Film FP Software can be used for a wide range of applications including alloy plating with lead-free solder and composite plating.

3. Measurement of Microscoopic Area
Round 15 µm collimator standard installed, effective for measuring coating thickness in microscopic areas.

4. High Power X-ray Tube
Equipped with 75 W high-powered x-ray tube.

5. Observation of Microscopic Areas
Can easily observe microscopic areas, equipped with four-step zoom.

6. Large Stage (FT9455)
Large stage enables measurement of large printed circuit boards.

Specifications

  • Applications: coating
  • Other characteristics: benchtop

Other items

In this category | In this category, (Hitachi High-Technologies Europe)

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