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Conventional Microscopes

Specs Scientific Instruments

  • Scanning probe microscope / variable temperature / for research

Article: 00031741

Scanning probe microscope / variable temperature / for research

Variable Temperature Scanning Probe Microscope for AFM and STM operation


Features:

Outstanding mechanical stability
Ultra fast handling
Temperature range 90 - 400 K
Excellent temperature stability
No need for sensor replacement

Product Description:

To extend the proven concept of the STM Aarhus 150 to image insulating surfaces on the atomic scale, SPECS applies the quartz KolibriSensor? for ultimate non-contact atomic force microscopy (NC-AFM) performance.

In combination with a Nanonis control system with state-of-the-art low noise frequency demodulation the SPM Aarhus 150 opens scientists the atomic view on all surfaces. With the sensor tip being contacted separately, force and tunneling current signals can be recorded independently and simultaneously.

With ?in-situ? sensor preparation, the Aarhus SPM makes atomic resolution imaging achievable on a daily basis.

Specifications

  • Type: scanning probe
  • Options and accessories: variable temperature
  • Technical applications: for research

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