• Scanning electron microscope / digital camera / for analysis / compact

Phenom XL

Article: 00049049

Scanning electron microscope / digital camera / for analysis / compact

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system.

It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities.

Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click within seconds.

Specifications

  • Type: scanning electron
  • Options and accessories: digital camera
  • Technical applications: for analysis
  • Other characteristics: compact
  • Optical resolution: 20 nm

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