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  • Scanning electron microscope with focused ion probe / computerized

NX2000

Article: 00049020

Scanning electron microscope with focused ion probe / computerized

Toward the ultimate TEM sample preparation system

FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials. An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics technologies.
Hitachi's NX2000 high performance FIB and high resolution SEM system with its unique sample orientation control* and triple beam* technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications.
* Option

Specifications

  • Type: scanning electron with focused ion probe
  • Options and accessories: computerized
  • Optical resolution: 4 nm, 60 nm

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