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  • Roughness and microtopographic measuring machine

i-Dex ta

Article: 00054434

Roughness and microtopographic measuring machine

The I-Dex ta is a roughness and micro-topographic measuring machine developed by ISIS Sentronics. It is built with non-contact optical metrology suitable for a wide range of applications. The unit comes with 1D and 2D roughness in sub-µm range, and 3D micro-topographies.

The system features automatic measurement of several objects in a single operation, x/y-precision measuring stage with precise stepping motor positioning, vibration-free measurement, and TopoSpect and TopoLine user-friendly software. In addition, the framework is available with optional high-resolution CMOS camera.

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