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Gamma spectrometers, scintillation counters

Oxford Instruments - NanoAnalysis

  • X-ray detector / silicon drift

X-MaxN 80 TLE

Article: 00055864

X-ray detector / silicon drift

The X-MaxN range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ?next generation? SDD performance.

X-MaxN TEM detectors use the latest low noise detector designs for excellent resolution and sensitivity ? even at high count rates.
Overview

Specially designed for routine TEM applications, the large-area 80 mm2 sensor of the X-MaxN 80 T provides superb solid angle and analytical performance.

Designed to maximise throughput and low energy sensitivity
Excellent resolution with guaranteed Mn specification at 50,000 cps
Optimised take-off angle for best peak-to-background ratios and light element detection
Proven performance on all classes of TEM including field emission, aberration corrected microscopes
Count rates conducive to acquiring X-ray maps quickly, including real-time background removal and peak deconvolution using AZtecTEM TruMap software

Specifications

  • Measured value: X-ray, silicon drift

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