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  • Semiconductor characterization software
  • Semiconductor characterization software

ACS

Article: 00069240

Semiconductor characterization software

The Automated Characterization Suite (ACS) interactive software is designed for monitoring semiconductor device characterization, parametric tests, reliability tests, and component functional tests. Users without prior experience will be able to navigate the intuitive GUI software with ease.

The ACS software can also be used in various Keithley systems, including the S500 and S530 systems.

Specifications

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In this category | In this category, (Keithley Instruments)

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