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  • Electronic 3D speckle interferometer

0.01 - 0.1 µm | Q-300 TCT

Article: 00195835

Electronic 3D speckle interferometer

Thermal Expansion Measurement - Characterization of electronic components and determination of CTE The 3D electronic speckle interferometry is a very powerful tool to investigate the thermal expansion of MEMS and electronic components. Due ...

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