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Milling Machines Machining Centers Universal Multi Spindle

Jeol

JIB-4000

Article: 00085360

3-axis milling system / universal / ion beam

The Panasonic JIB-4000 is a single-beam FIB system that features a high-performance ion column. A focused Ga ion beam is applied in a sample to allow SIM image monitoring of its surface, milling and deposition of objects such as carbon or tungsten.
This system can also fabricate cross-section samples to monitor the thin film specimen for TEM imaging. This SIM imaging system shows better channeling than SEM imaging because of their noticeable differences in crystal orientation. Furthermore, it can cater a maximum ion beam current of 60 nA that allows quick cross section milling ideal for observing cross sections of layered coatings and metallic objects.

Specifications

  • Number of axes: 3-axis
  • Spindle orientation: universal
  • Technology: ion beam

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