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  • SEM sample preparation system


Article: 00071026

SEM sample preparation system

CroIon Slicer functions to a long retention extent enabling full reduction of damage. Ion accelerating voltage approximates from 1 to 8kV, tilt angle can be positioned up to 6° and ion-beam diameter measures 500 µm or more. Primarily, it helps in the arrangement of TEM thin film/SEM cross section samples of heat sensitive equipment. Through the use of liquid nitrogen, it helps lessen unnecessary thermal damage that can affect the system during ion irradiation.


  • Options: for SEM

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