OLGEP 12/12 M 50 G2-K2.5-TS

Article: 00080849

Measuring light barrier / infrared with visible beam / IP67 / high-performance

- Light barrier system for detection of silicon wafer double layers and fragments
- Detection of wafer fragments larger 15 mm
- Electronic potentiometer for adjusting wafer thickness and fragement size
- Input for switching between wafer sizes 125 mm and 156 mm
- Small size for mounting between two belts
- Metal casing
- High protection class

Specifications

  • Function: measuring
  • Type of beam: infrared with visible beam
  • Protection level: IP67
  • Other characteristics: high-performance
  • Operating range: Min.: 125 mm

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