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Outside Micrometers Thickness Gauges

Stellarnet

  • Film thickness measuring machine
  • Film thickness measuring machine

Article: 00104933

Film thickness measuring machine

TF Systems for Non-Contact
Film Thickness Measurements

We offer a complete line of film thickness measurement systems that can measure from 5 nm to 200 µm for analysis of single layer and/or multilayer films in less than a second. StellarNet thin film reflectometry systems consist of a portable USB spectrometer coupled to a reflectance probe and light source. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance. Several spectrometer models are available to suit your thin film and/or optical measurement requirements.

Thin Film Applications
Solar PV
Increased production of Thin-Film Photovoltaics (TFPVs) is becoming more predominant due to lower costs than their silicon-wafer-based cousins. Getting the accurate thickness measurement is extremely crucial to efficiency and reliability as well as maintaining production costs. Films include active layers such as thin silicon, II-VI materials such as CdTe, and CIGS (copper indium gallium selenide). Additionally, TCO (transparent conductive oxide) stacks, polyimides and resists used to define cells and electrodes, as well as anti-reflection coatings can all be measured with StellarNet Thin Film Measurement systems.

Specifications

  • Applications: film

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